Zamani, Reza (Date of defense: 2013-11-04)
In this report novel materials for advanced applications are studied by means of the latest microscopy technologies and methodologies which have had a dramatic impact on progress of materials science. ...
Estradé Albiol, Sònia (Date of defense: 2009-02-21)
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic ...