Combined Transmission Electron Microscopy and In-Situ Scanning Tunneling Microscopy Characterization of Nanomaterials 

Martín Malpartida, Gemma (Fecha de defensa: 2018-07-02)

The main goal of this thesis has been to apply in-situ Transmission Electron Microscopy (TEM) electrical measurements using a Scanning Tunneling Microscopy (STM) tip, combined with TEM imaging and spectroscopic techniques, ...