Estradé Albiol, Sònia (Date of defense: 2009-02-21)
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic ...
Ciències Experimentals i Matemàtiques (1)
Electron energy loss spectroscopy (1)
Espectroscopía por pérdidas de energía de electrones (1)